Double negatively charged carbon vacancy at the h- and k-sites in 4H-SiC: Combined Laplace-DLTS and DFT study

作者:Capan Ivana*; Brodar Tomislav; Pastuovic Zeljko; Siegele Rainer; Ohshima Takeshi; Sato Shin ichiro; Makino Takahiro; Snoj Luka; Radulovic Vladimir; Coutinho Jose; Torres Vitor J B; Demmouche Kamel
来源:Journal of Applied Physics, 2018, 123(16): 161597.
DOI:10.1063/1.5011124

摘要

We present results from combined Laplace-Deep Level Transient Spectroscopy (Laplace-DLTS) and density functional theory studies of the carbon vacancy (V-C) in n-type 4H-SiC. Using Laplace-DLTS, we were able to distinguish two previously unresolved sub-lattice-inequivalent emissions, causing the broad Z(1/2) peak at 290K that is commonly observed by conventional DLTS in n-type 4H-SiC. This peak has two components with activation energies for electron emission of 0.58 eV and 0.65 eV. We compared these results with the acceptor levels of V-C obtained by means of hybrid density functional supercell calculations. The calculations support the assignment of the Z(1/2) signal to a superposition of emission peaks from double negatively charged V-C defects. Taking into account the measured and calculated energy levels, the calculated relative stability of V-C in hexagonal (h) and cubic (k) lattice sites, as well as the observed relative amplitude of the Laplace-DLTS peaks, we assign Z(1) and Z(2) to V-C(h) and V-C(k), respectively. We also present the preliminary results of DLTS and Laplace-DLTS measurements on deep level defects (ET1 and ET2) introduced by fast neutron irradiation and He ion implantation in 4H-SiC. The origin of ET1 and ET2 is still unclear. Published by AIP Publishing.

  • 出版日期2018-4-28