Amendment of cavity perturbation method for measuring dielectric properties of medium loss sample at microwave frequencies

作者：Banerjee Prasun^*; Ghosh Gautam; Biswas Salil Kumar

来源：Optoelectronics and Advanced Materials-Rapid Communications, 2012, 6(5-6): 623-626.

• Dielectric properties
• Microwave frequencies
• X-Band
• Cavity perturbation method

The conventional cavity perturbation method of placing the sample on the broad wall of a rectangular cavity resonator is altered by placing the sample on a narrow wall of the cavity and an analytical formula is proposed for measuring the dielectric properties of medium loss materials at microwave frequencies. Advantages and limitations of the analytical technique over earlier approaches of calibration techniques are also presented.

• 出版日期2012-6