Nanoindentation and contact-mode imaging at high temperatures

作者:Schuh CA*; Packard CE; Lund AC
来源:Journal of Materials Research, 2006, 21(3): 725-736.
DOI:10.1557/JMR.2006.0080

摘要

Technical issues surrounding the use of nanoindentation at elevated temperatures are discussed, including heat management, thermal equilibration, instrumental drift, and temperature-induced changes to the shape and properties of the indenter tip. After characterizing and managing these complexities, quantitative mechanical property measurements are performed on a specimen of standard fused silica at temperatures up to 405 degrees C. The extracted values of hardness and Young's modulus are validated against independent experimental data from conventional mechanical tests, and accuracy comparable to that obtained in standard room-temperature nanoindentation is demonstrated. In situ contact-mode images of the surface at temperature are also presented.

  • 出版日期2006-3