科研之友
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摘要
This study was conducted to investigate the mechanism of nerve damage caused by fluoride ion (F) exposure. PC12 cells, from rat adrenal medulla pheochromocytoma, were treated with different F concentrations (0.005, 0.05, 0.5, 2.5, and 5 mM). Intracellular reactive oxygen species (ROS) levels were detected with a ROS Assay Kit after 2hr of F exposure. Cell viability was detected using the Cell Counting Kit-8 (CCK-8) at different time points (2, 4, 6, 8, 12, 24, and 48 hr). Morphological changes were observed with an inverted microscope after 24 hr of F exposure. Cell apoptosis was detected using Hoechst 33342 dye after 8 hr of F exposure. The results showed that cell viability was negatively correlated with F exposure duration. After 12 and 24 hr of F exposure, cell viability showed a dose-response relationship with the F content. For a certain duration of F exposure, the levels of intracellular ROS, cell damage, and cell apoptosis showed a approximately linear relationship with the level of F exposure. These findings suggest that intracellular oxidative stress, induced by F exposure, might be one of the reasons for the cell apoptosis induced by F and support the theory that F toxicity may result from fluoride-induced free radical damage. In addition, the results suggest that cell apoptosis might be a key step in the pathophysiology of F-induced nerve damage.
- 出版日期2015-9
- 单位浙江师范大学
