科研之友
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摘要
A detailed dope depth distribution investigation in rapidly solidified (RS) foils of Al alloys has been made using the Rutherford backscattering spectroscopy technique. We found that at the foil surface (0.04-0.06 mu m) the dope concentration exceeds the experimental measured concentration. We also found that the Me concentration oscillates through the thickness of the investigated layers. However, in the RS Al-Ge alloy no dope oscillation was detected.
- 出版日期2000-3-14
