Anisotropy analysis of energy in Ag/Si twist interface

作者：Xin, H; Zhang, JM^*; Wei, XM; Xu, KW

来源：Surface and Interface Analysis, 2005, 37(7): 608-614.

DOI：10.1002/sia.2054

• Ag/Si
• interface energy
• calculation
• MEAM

The energies in three combinations of Ag(001)/Si(111), Ag(011)/Si(111) and Ag(111)/Si(111) twist boundaries have been calculated using the modified embedded atom method (MEAM). The results show that the interface energies corresponding to Ag(111)/Si(111), Ag(001)/Si(111) and Ag(011)/Si(111) increase successively and the lowest energies 365, 717.7 and 996.1 mJ m(-2) corresponding to each interface appear at twist angles 0 of 30, 0 and 25.24 degrees, respectively. Considering minimization of interface energy, we can conclude that the Ag films deposited on Si(111) substrate will result in a (111) preferred orientation, especially at a twist angle of theta = 30 degrees.

• 出版日期2005-7
• 单位陕西师范大学; 西安交通大学