Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design

作者：Gonnissen J; De Backer A; den Dekker A J; Sijbers J; Van Aert S^*

来源：Ultramicroscopy, 2016, 170: 128-138.

DOI：10.1016/j.ultramic.2016.07.014

• High-resolution scanning transmission electron microscopy (HR STEM)
• Electron microscope design and characterisation
• Data processing/image processing

In the present paper, the optimal detector design is investigated for both detecting and locating light atoms from high resolution scanning transmission electron microscopy (HR STEM) images. The principles of detection theory are used to quantify the probability of error for the detection of light atoms from HR STEM images. To determine the optimal experiment design for locating light atoms, use is made of the so-called Cramer-Rao Lower Bound (CRLB). It is investigated if a single optimal design can be found for both the detection and location problem of light atoms. Furthermore, the incoming electron dose is optimised for both research goals and it is shown that picometre range precision is feasible for the estimation of the atom positions when using an appropriate incoming electron dose under the optimal detector settings to detect light atoms.

• 出版日期2016-11