Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip

作者：Du, Xuecheng; He, Chaohui^*; Liu, Shuhuan; Zhang, Yao; Li, Yonghong; Yang, Weitao

来源：Journal of Nuclear Science and Technology, 2017, 54(3): 287-292.

DOI：10.1080/00223131.2016.1262294

• System-on-chip
• radiation effect
• single event effects
• alpha particle

Single event effect susceptibility of the Xilinx Zynq-7010 System-on-Chip (SoC) was investigated. Seven hardware blocks in the Zynq-7010 SoC were tested for single event effects using americium-241 alpha radiation source. Four error types, data error, single event upset and functional interrupt events, time-out, and system halt, were observed in different blocks under test. The dynamic cross sections of the different blocks were obtained and the reasons of some critical error types were analyzed.

• 出版日期2017
• 单位西安交通大学