Double-trap model for hysteretic current-voltage characteristics of a polystyrene/ZnO nanorods stacked layer

作者：Wu You Lin; Lin Jing Jenn; Lin Shih Hung^*; Sung Yi Hsing

来源：Solid-State Electronics, 2017, 137: 58-61.

DOI：10.1016/j.sse.2017.08.003

• Double-trap
• Nanorods
• Hysteretic current-voltage
• ZnO

Hysteretic current-voltage (I-V) characteristics are quite common in metal-insulator-metal (MIM) devices used for resistive switching random access memory (RRAM). Two types of hysteretic I-V curves are usually observed, figure eight and counter figure eight (counter-clockwise and clockwise in the positive voltage sweep direction, respectively). In this work, a clockwise hysteretic I-V curve was found for an MIM device with polystyrene (PS)/ZnO nanorods stack as an insulator layer. Three distinct regions I similar to V, I similar to V-2, and I similar to V-0.6 are observed in the double logarithmic plot of the I-V curves, which cannot be explained completely with the conventional trap-controlled space-charge-limited-current (SCLC) model. A model based on the energy band with two separate traps plus local energy variation and trap-controlled SCLC has been developed, which can successfully describe the behavior of the clockwise hysteretic I-V characteristics obtained in this work.

• 出版日期2017-11