X-band rf structure with integrated alignment monitors

作者:Dehler M*; Raguin J Y; Citterio A; Falone A; Wuensch W; Riddone G; Grudiev A; Zennaro R
来源:Physical Review Special Topics - Accelerators and Beams, 2009, 12(6): 062001.
DOI:10.1103/PhysRevSTAB.12.062001

摘要

We present the electrical design for an X-band traveling wave accelerator structure with integrated alignment monitors to measure the transverse wake, which will be used as part of the PSI-XFEL project and in the CLIC structure testing program. At PSI, it will compensate nonlinearities in the longitudinal phase space at the injector prototype of the PSI-XFEL. At CLIC it will be tested for breakdown limits and rates in the high gradient regime. The prolonged operation of such a structure in the PSI-XFEL injector, albeit not for the CLIC parameter regime, will constitute a good quality test of the manufacturing procedures employed. The operation in the PSI-XFEL injector will be at a relatively modest beam energy of 250 MeV, at which transverse wakes can easily destroy the beam emittance. For this reason, the layout chosen employs a large iris, 5 pi/6 phase advance geometry, which minimizes transverse wakefield effects while still retaining a good efficiency. As a second important feature, the design includes two wakefield monitors coupling to the transverse higher order modes, which allow steering the beam to the structure axis, potentially facilitating a higher precision than mechanical alignment strategies. Of special interest is the time domain envelope of these monitor signals. Local offsets due to bends or tilts have individual signatures in the frequency spectrum, which in turn are correlated with different delays in the signal envelope. By taking advantage of this combined with the single bunch mode at the PSI-XFEL, the use of a relatively simple detector-type rf front end should be possible, which will not only show beam offsets but also higher order misalignments such as tilts in the structure. The resolution of these monitors is determined by the tolerance of the random cell-to-cell misalignment leading to a spurious signal in the monitors.

  • 出版日期2009-6