A non-contact graphene surface scattering rate characterization method at microwave frequency by combining Raman spectroscopy and coaxial connectors measurement

作者：Wei, Xing-Chang; Xu, Yi-Li; Meng, Nan; Xu, Yang; Hakro, Ayaz; Dai, Gao-Le; Hao, Ran; Li, Er-Ping

来源：Carbon, 2014, 77: 53-58.

DOI：10.1016/j.carbon.2014.04.095

A non-contact method is proposed to characterize graphene at microwave frequency by combining Raman spectroscopy and Amphenol Precision Connector (APC-7). The CVD-grown graphene is transferred to the ring-shape Teflon substrate and characterized by Raman spectroscopy to estimate its doping density and the related Fermi energy. The graphene is then sandwiched between two APC-7 coaxial connectors and S parameters under transverse electromagnetic (TEM) mode normal incident waves are measured to extract the surface conductivity through transmission matrix, in which the de-embedding process can be avoided. By combing the Kubo formula with our proposed circuit model, the scattering rate of graphene on Teflon substrate is obtained and analyzed.

• 出版日期2014-10
• 单位浙江大学