Analysis of residual stresses resulting from the surface preparation for X-ray diffraction measurement

作者：Mishchenko Andrii; Wu Leonardo; da Silva Vanessa K; Scotti Americo

来源：Journal of the Brazilian Society of Mechanical Sciences and Engineering, 2018, 40(2): UNSP 94.

DOI：10.1007/s40430-018-1036-5

• Residual stress
• X-ray diffraction
• Preprocessing
• Surface stresses
• Electrolytic removal

There is no consensus in the literature on the need to remove preprocessing layers from the material prior to the measurement of residual stresses by X-ray diffractometer. Thus, the purpose of this work was to evaluate the residual stresses induced by material preprocessing and its evolution during the preparation of the surface by electrolytic removal. Sample surfaces were pre-processed by grinding and sandblasting and the resulting residual stresses were measured by X-ray diffractometry. At each removal stage, the evolution of residual stresses, hardness and microstructure of the surface were verified. It was concluded that different preprocessing methods can induce surface residual stresses of either tension or compression, reaching different depths. Removal by electrolytic method of the modified layer has shown itself capable of reducing significantly the magnitude of the residual stresses induced by preprocessing. On the other hand, the depth of deformed grains or surface hardness proved to be incapable of predicting the depth of induced residual stresses. Finally, it was discussed whether or not the layers removed by this method reveal the subsurface stresses and if the removal should take place before or after a second processing.

• 出版日期2018-2