A coverage-driven Constraint random-based functional verification method of memory controller

作者:Wu Yingpan; Yu Lixin; Lan Lidong; Zhou Haiyang
来源:19th IEEE/IFIP International Symposium on Rapid System Prototyping, 2008-06-02 to 2008-06-05.
DOI:10.1109/RSP.2008.12

摘要

This paper presents a coverage-driven Constraint random-based functional verification method of memory controller in a microprocessor. Many special functions are integrated into this memory controller for anti-radiating, so it is more difficult to verify. This system of verification, which is creating by means of verification methodology manual (VMM) for systemverilog and classification trees, is reusable, scalable, configurable and can reduce time of verification.

  • 出版日期2008
  • 单位北京微电子技术研究所