摘要

An improved Allan variance method is proposed for the noise characteristics analysis of the synthetic aperture interferometer (SAI). This improved Allan variance method is derived from the theory of the traditional Allan variance method as well as a priori information about the components of the system noise. It can be used to identify the different types of the noise and give the corresponding intensity coefficients of the power spectral density (PSD) of those noises in the SAI. This improved Allan variance method has been verified through the simulating calculation of a known band-pass mixed noise which consists of a white noise and a flicker noise and is generated in MATLAB. Finally this improved Allan variance method has been successfully used in the noise analysis of the SABI, which is very significant for the noise reduction elimination and the performance improvement.