Built-in self-test structure for fault detection of charge-pump phase-locked loop

作者：Xia, Lanhua; Wu, Jianhui^*; Huang, Cheng; Zhang, Meng

来源：IET Circuits Devices & Systems, 2016, 10(4): 317-321.

DOI：10.1049/iet-cds.2015.0224

• charge pump circuits
• phase locked loops
• built-in self test
• phase detectors
• flip-flops
• charge pump phase locked loop
• fault detection
• defect-oriented built-in self-test structure
• BIST structure
• overhead test solution
• phase detector
• frequency detector
• D flip-flop
• stimulus generator
• feature extracted devices
• fault simulation
• fault coverage

A defect-oriented built-in self-test (BIST) structure of charge-pump phase-locked loop (CP-PLL) for high fault coverage and low area overhead test solution is proposed. It employs a new structure of phase/frequency detector, a D flip-flop and some existing blocks in the PLL as the input stimulus generator and fault feature extracted devices for testing evaluation. Thus, no extra test stimulus or high-performance measured instruments are required for test. The structure is easily implemented and has a little influence on the performance of CP-PLL. Fault simulation results indicate that the proposed BIST structure has high fault coverage (98.75%) and low area overhead (0.78%).

• 出版日期2016-7
• 单位东南大学