科研之友
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摘要
Recent developments in frequency modulation atomic force microscopy enable simultaneous measurement of frequency shift and time-averaged tunneling current. Determination of the interaction force is facilitated using an analytical formula, valid for arbitrary oscillation amplitudes [Sader and Jarvis, Appl. Phys. Lett. 84, 1801 (2004)]. Here we present the complementary formula for evaluation of the instantaneous tunneling current from the time-averaged tunneling current. This simple and accurate formula is valid for any oscillation amplitude and current law. The resulting theoretical framework allows for simultaneous measurement of the instantaneous tunneling current and interaction force in dynamic atomic force microscopy.
- 出版日期2010-7-26
