A methodology to account for the finger interruptions in solar cell performance

作者:De Rose R*; Malomo A; Magnone P; Crupi F; Cellere G; Martire M; Tonini D; Sangiorgi E
来源:Microelectronics Reliability, 2012, 52(9-10): 2500-2503.
DOI:10.1016/j.microrel.2012.07.014

摘要

In this work we propose a methodology based on a mixed-mode simulation approach to evaluate the impact of finger interruptions in the front-side metallization on the solar cell performance. We apply the proposed methodology to typical finger profiles realized with double screen-printing technology. The efficiency degradation induced by finger interruptions is studied as a function of interruption size, interruption position, number of interruptions and finger resistivity.

  • 出版日期2012-10