Aberration-Corrected Transmission Electron Microscopic Study of the Central Dark Line Defect in Human Tooth Enamel Crystals

作者：Reyes Gasga Jose^*; Hemmerle Joseph; Bres Etienne F

来源：Microscopy and Microanalysis, 2016, 22(5): 1047-1055.

DOI：10.1017/S1431927616011648

• hydroxyapatite
• human tooth enamel crystals
• central dark line defect
• C-s-corrected high-resolution transmission electron microscopy
• atomic resolution high-angle annular dark-field scanning transmission electron microscopy

Angstrom resolution images of human tooth enamel (HTE) crystallites were obtained using aberration-corrected high-resolution transmission electron microscopy and atomic-resolution scanning transmission electron microscopy in the modes of bright field, annular dark field, and high-angle annular dark-field. Images show that the central dark line (CDL) defect observed around the center of the HTE crystals is a site for caries formation in the HTE and has a thickness of similar to 0.2 nm. Results also suggest that the CDL goes through one of the OH- planes.

• 出版日期2016-10