Nanoindentation Creep Behavior of Nanocomposite Sn-Ag-Cu Solders

作者:Roshanghias A*; Kokabi A H; Miyashita Y; Mutoh Y; Ihara I; Fatt R G Guan; Madaah Hosseini H R
来源:Journal of Electronic Materials, 2012, 41(8): 2057-2064.
DOI:10.1007/s11664-012-2086-6

摘要

High-density, ultrasmall-pitch electronic applications require miniaturized solder bumps with improved thermomechanical performance. In addition, novel techniques which are able to precisely characterize these solder bumps are needed. One approach to meeting both of these requirements is to make use of recently developed nanocomposite solders with enhanced creep resistance, and to characterize these solders using a nanoindentation technique. In the present study, the creep behavior of ceria-reinforced nanocomposite solder foils fabricated by the accumulative roll-bonding process was characterized using a depth-sensing nanoindentation technique. It was found that the creep resistance of the composites increased with increasing volume fraction of CeO2 reinforcement, and it was deduced that the creep deformation of this nanocomposite proceeded by deformation of the matrix, with the role of the reinforcement being to increase the creep resistance by reducing the effective stress acting on the matrix. The values of the creep exponent suggested that the dominant creep deformation mechanisms involved were diffusion creep and grain boundary sliding.

  • 出版日期2012-8