Noise Modeling and Analysis of SAR ADCs

作者：Zhang, Wenpian Paul^*; Tong, Xingyuan

来源：IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2015, 23(12): 2922-2930.

DOI：10.1109/TVLSI.2014.2379613

• Analog-to-digital converter (ADC)
• noise
• successive approximation register (SAR)
• switched capacitor

A generic statistical model for calculating input-referred noise of an analog-to-digital converter (ADC) impaired by thermal noise is proposed. Based on this model, detailed statistical analyses are performed on three successive approximation register (SAR) ADCs and the analytical results obtained are verified with Monte Carlo simulations. To compare the input-referred noise of different SAR ADC architectures, a noise gain factor is proposed, which relates the noise at the comparator input (top plate of capacitor array) to that at the ADC input. The noise gain factors are computed and compared for all three ADCs analyzed. The model and methodology presented in this paper can be applied to various ADC architectures for circuit design and optimization.

• 出版日期2015-12
• 单位西安邮电大学