Annular Focused Electron/Ion Beams for Combining High Spatial Resolution with High Probe Current

作者：Khursheed Anjam^*; Ang Wei Kean

来源：Microscopy and Microanalysis, 2016, 22(5): 948-954.

DOI：10.1017/S1431927616011594

• annular focused electron
• ion beams
• aberration correction
• focused electron
• ion beam columns
• core lenses
• objective lens

This paper presents a proposal for reducing the final probe size of focused electron/ion beam columns that are operated in a high primary beam current mode where relatively large final apertures are used, typically required in applications such as electron beam lithography, focused ion beams, and electron beam spectroscopy. An annular aperture together with a lens corrector unit is used to replace the conventional final hole-aperture, creating an annular ring-shaped primary beam. The corrector unit is designed to eliminate the first- and second-order geometric aberrations of the objective lens, and for the same probe current, the final geometric aberration limited spot size is predicted to be around a factor of 50 times smaller than that of the corresponding conventional hole-aperture beam. Direct ray tracing simulation is used to illustrate how a three-stage core lens corrector can be used to eliminate the first- and second-order geometric aberrations of an electric Einzel objective lens.

• 出版日期2016-10