Discriminating thermal effect in nonlinear-ellipse-rotation-modified Z-scan measurements

作者:Liu Zhi Bo; Shi Shuo; Yan Xiao Qing; Zhou Wen Yuan; Tian Jian Guo*
来源:Optics Letters, 2011, 36(11): 2086-2088.
DOI:10.1364/ol.36.002086

摘要

We report that a modified Z-scan method by nonlinear ellipse rotation (NER) can be used to discriminate true nonlinear refraction from thermal effect in the transient regime and steady state. The combination of Z-scan and NER allows us to measure the third-order nonlinear susceptibility component without the influence of thermal-optical nonlinearity. The experimental results of pure CS(2) and CS(2) solutions of nigrosine verify that the transient thermal effect can be successfully eliminated from the NER-modified Z-scan measurements. This method is also extended to the case in which thermal-optical nonlinearities depend on a high repetition rate of femtosecond laser pulses for the N,N-dimethylmethanamide solutions of graphene oxide.