Testing of crosstalk-type dynamic faults in interconnection networks with use of ring LFSRs

作者：Hlawiczka Andrzej^*; Gucwa Krzysztof; Garbolino Tomasz; Kopec Michal

来源：Przeglad Elektrotechniczny, 2010, 86(11A): 133-137.

• Linear ring register
• Test pattern generator
• Crosstalks
• System on a Chip (SoC)
• Interconnect network

The need to apply the test-per-clock method at full clock rates to test crosstalks in networks of long interconnects between modules in a System on a Chip (SoC) is highlighted. Our method involves the 3n-R-LFSR (Ring Linear Feedback Shift Register). The part of the R-LFSR that generates test patterns for n-interconnects has double number of flip-flops where every second flip-flop is connected to the network of Interconnects Under Test (IUT). It has been proved that the 3n-R-LFSR is capable to generate all the two-test patterns that are necessary for IUT. The completed simulation experiments evidenced efficiency of the method application to test crosstalks that are manifested by either a glitch or an edge delay.

• 出版日期2010