AFM improves resolution of IR spectroscopy

作者:Prater Craig*; Kjoller Kevin; Shetty Roshan; Dazzi Alexandre
来源:Laser Focus World, 2011, 47(3): 52-54.

摘要

Combining infrared spectroscopy with probe microscopy provides a powerful new analytical instrument capable of simultaneous nanoscale chemical and physical analysis of materials.

  • 出版日期2011-3