Fault Detection Based on Statistical Multivariate Analysis and Microarray Visualization

作者:Ma, Ming-Da*; Wong, David Shan-Hill; Jang, Shi-Shang; Tseng, Sheng-Tsaing
来源:IEEE Transactions on Industrial Informatics, 2010, 6(1): 18-24.
DOI:10.1109/TII.2009.2030793

摘要

In this work, a statistical method is proposed to mine out key variables from a large set of variables recorded in a limited number of runs through a multistage multistep manufacturing process. The method employed well-known single variable or multivariable techniques of discrimination and regression but also presented a synopsis of analysis results in a colored map of p-values very similar to a DNA microarray. This framework provides a systematic method of drawing inferences from the available evidence without interrupting the normal process operation. The proposed concept is illustrated by two industrial examples.