摘要

Recently, room temperature or near room temperature InAs detectors are widely used in laser warning receivers, process control monitors, temperature sensors, etc. requiring linear operation over many decades of the sensitivity range. The linearity of zero biased Si, InGaAs and Ge detectors is thoroughly discussed in the literature, contrary to InAs detectors. In an earlier work of the authors it has been demonstrated that applying a bootstrap circuit to a Ge detector - depending on the frequency of the operation - will virtually increase the shunt resistance of the detector by 3-6 decades compared to the detector alone. In the present work, a similar circuitry was applied to a room temperature InAs detector, the differences between the bootstrapped Ge and bootstrapped InAs detector are underlined. It is shown, how the bootstrap circuit channels the photogenerated current to the feedback impedance decreasing with many decades the detectable low level limit of the detector - I/V converter unit. The linearity improvement results are discussed as a function of the chopping frequency, calculated and measured values are compared, the noise sources are analyzed and noise measurement results are presented.

  • 出版日期2014