Atomic spectrometry update. X-Ray fluorescence spectrometry

作者：West Margaret^*; Ellis Andrew T; Potts Philip J; Streli Christina; Vanhoof Christine; Wegrzynek Dariusz; Wobrauschek Peter

来源：Journal of Analytical Atomic Spectrometry, 2009, 24(10): 1289-1326.

DOI：10.1039/b915056k

This is the latest review covering atomic spectrometric activities using XRF techniques. It offers a comprehensive review of instrumentation and detectors, matrix correction and spectrum analysis procedures, X-ray optics and micro-fluorescence, SRXRF, TXRF plus handheld and portable XRF as assessed from the published literature. As techniques mature, the application sections have expanded to report developments in sample preparation, geological and industrial minerals, environmental, archaeological, forensic, biological, clinical, thin films, chemical state and speciation studies. They also reflect how the XRF technique is increasingly being used to provide analytical measurements that are then combined with results from more specialised techniques to report comprehensive material characterisation. The commercial availability of silicon drift detectors (SDD) has transformed the handheld EDXRF market this year by extending in situ analytical capabilities down to magnesium. Imaging techniques that provide either 2D or 3D mapping facilities continue to feature this year along with further developments in SR and TXRF systems. The writing team would welcome feedback from readers of this review and invite you to complete the Atomic Spectrometry Updates questionnaire at www.asureviews.org.

• 出版日期2009