Multifractal spectra of atomic force microscope images of Cu/Fe nanoparticles based films thickness

作者：Talu Stefan; Stach Sebastian; Solaymani Shahram; Moradian Rostam; Ghaderi Atefeh; Hantehzadeh Mohammad Reza; Elahi Seyed Mohammad; Garczyk Zaneta; Izadyar Sara

来源：Journal of Electroanalytical Chemistry, 2015, 749: 31-41.

DOI：10.1016/j.jelechem.2015.04.009

• Cu/Fe nanoparticles
• DC-magnetron sputtering system
• AFM
• Multifractal analysis
• Surface morphology
• Surface roughness

This paper analyses the thickness influence of Fe on Cu nanoparticles (NPs) synthesised by Direct-current (DC) magnetron sputtering on the three-dimensional (3-D) surface morphology of thin films.
The thin films with Cu nanoparticles were deposited on glass substrates then; Fe nanoparticles were added to Cu ones. These nanostructures were investigated at one deposition thickness of Cu and three of Fe (Cu 55 nm, Cu 55 nm/Fe 40 nm, Cu 55 nm/Fe 55 nm, and Cu 55 nm/Fe 70 nm as thin films' thickness), by means of X-ray diffraction, atomic force microscopy (AFM) and multifractal analysis, in order to evaluate the structure and relation among the 3-D micro-textured surface.
The 3-D morphology of surface samples exhibits multifractal features characterized by nano-irregularities of various orders of size and different local densities spread on the surface. The local and global scale properties of 3-D surface geometry were quantitatively estimated using the generalized dimension D-q and the singularity spectrum got). The non-uniformity of the nano-irregularities are correlated with the generalized dimension D-q and the spectrum width Delta alpha (Delta alpha = alpha(max) - alpha(min)) of the multifractal spectra f(alpha).
Multifractal approach in correlation with the surface statistical parameters are a sensitive and reliable tool for quantifying the thickness influence of Fe on Cu nanoparticles (NPs) synthesised by Direct-current (DC) magnetron sputtering on the 3D surface morphology of thin films.

• 出版日期2015-7-15