A comprehensive investigation on the phase transformation behavior and electrical properties of (Pb1-xBax)ZrO3 (0 <= x <= 0.5) thin films

作者：Hao Xihong; Zhai Jiwei^*; Yao Xi

来源：Journal of Applied Physics, 2008, 104(12): 124101.

DOI：10.1063/1.3041153

• barium compounds
• dielectric polarisation
• ferroelectric Curie temperature
• ferroelectric thin films
• ferroelectric transitions
• grain size
• lead compounds
• relaxor ferroelectrics
• sol-gel processing

(Pb1-xBax)ZrO3 (PBZ) (0 <= x <= 0.5) thin films were successfully fabricated on Pt(111)/TiO2/SiO2/Si substrates by the sol-gel technique, and the influence of the Ba2+ content on the microstructure, electrical properties, and phase transformation behavior of PBZ films was investigated in detail. With the increase in Ba2+ concentration, the orientation of the PBZ films was changed from (111) to (110) gradually. Simultaneously the grain size of the films decreased, and the surface became more and more homogeneous and uniform. The room-temperature state of PBZ thin films experienced a transformation from an antiferroelectric to a ferroelectric phase and then to a paraelectric phase with the increase in Ba2+ content. The typical ferroelectric relaxor behavior was observed due to the Ba2+ substitution, and the degree of the relaxor behavior was enhanced with the increase in Ba2+ content.

• 出版日期2008-12-15
• 单位同济大学