Double Compressive Stress Zones Model for Tin Whisker Growth

作者：Hao Hu^*; Guo Fu; Xu Guangchen; Shi Yaowu

来源：Rare Metal Materials and Engineering, 2012, 41: 59-62.

• SnAgCu solder
• rare earth Er
• tin whisker
• growth model

Mechanism of tin whisker growth on the surface of the oxidized ErSn3 phase was investigated by analyzing FIB images of the oxidized ErSn3 phase. The results indicate that many "rapid oxidation channels" and "oxidation zones" were formed inside the ErSn3 phase after its inhomogenous oxidation. Because two "oxidation zones", which were connected with "rapid oxidation channel", were formed below and around the root of whisker, respectively. Thus, a "double compressive stress zones" model for tin whisker growth was proposed as follows: two compressive stress zones are required for tin whisker growth, the "low compressive stress zone" that located at the root of whisker provides driving force for whisker formation and the "high compressive stress zone" provides tin atoms for whisker growth.

• 出版日期2012-9
• 单位北京工业大学