摘要

A novel analog circuit fault diagnosis approach is presented by using generalized multiple kernel learning- support vector machine (GMKL-SVM) algorithm. Firstly, the wavelet coefficients of measured time responses are generated as features by using a Haar wavelet transform. Then, wavelet features are used as samples to identify parameters for GMKL-SVM method with using quantum-behaved particle swarm optimization (QPSO) algorithm. As a result, classification model based on GMKL-SVM method is constructed to diagnosis analog circuit faults. Dignostics on both single fault and double faults demonstrate that the proposed GMKL-SVM method can obtain good diagostic performance on analog circuit fault diagnosis. Additionally, compared to the traditional GMKL-SVM method, the presented approach has higher diagnostic precision.

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