A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis Distance

作者：Han, Han^*; Wang, Houjun; Tian, Shulin; Zhang, Na

来源：Journal of Electronic Testing-Theory and Applications, 2013, 29(1): 95-102.

DOI：10.1007/s10836-012-5342-z

• Analog circuits
• Fault diagnosis
• Testability
• Mahalanobis distance

This paper presents a new analog circuit fault diagnosis method based on improved Mahalanobis Distance. The Mahalanobis Distance is improved according to the characteristics of analog circuit, and then introduced into analog circuit fault detection. First, the circuit testability was analyzed, and the relation of ambiguity groups was determined on the basis of the test matrix, and then the separable potential faulty components under the assumption of single fault were also determined. Finally, the suspicious components could be classified using the improved Mahalanobis Distance according to the feature values of the test points, so as to reduce the number of classes and enhance the speed when classifying faults. The experiment shows that the method can achieve fast analog circuit fault diagnosis and better results of analog circuit diagnosis detection.

• 出版日期2013-2
• 单位电子科技大学