Aberration corrected Lorentz scanning transmission electron microscopy

作者：McVitie S^*; McGrouther D; McFadzean S; MacLaren D A; O'Shea K J; Benitez M J

来源：Ultramicroscopy, 2015, 152: 57-62.

DOI：10.1016/j.ultramic.2015.01.003

• Lorentz microscopy
• Aberration correction
• Magnetic thin films
• Differential phase contrast

We present results from an aberration corrected scanning transmission electron microscope which has been customised for high resolution quantitative Lorentz microscopy with the sample located in a magnetic field free or low field environment. We discuss the innovations in microscope instrumentation and additional hardware that underpin the imaging improvements in resolution and detection with a focus on developments in differential phase contrast microscopy. Examples from materials possessing nanometre scale variations in magnetisation illustrate the potential for aberration corrected Lorentz imaging as a tool to further our understanding of magnetism on this lengthscale.

• 出版日期2015-3-24