A Highly Scalable Interface Fuse for Advanced CMOS Logic Technologies

作者:Yang Li Yu*; Hsieh Min Che; Liu Jheng Sin; Chin Yung Wen; Lin Chrong Jung
来源:IEEE Electron Device Letters, 2012, 33(2): 245-247.
DOI:10.1109/LED.2011.2175696

摘要

In this letter, we propose a novel interface fuse (iFuse) for low-power electrically programmable fuses in advanced CMOS applications. With an offset-landed metal-to-contact or contact-to-polysilicon structure, the iFuse can be programmed by substantially reduced current as compared to conventional fuses. A diagonal contact layout and the optical pattern correction scheme can further improve the cell stability as well as its programming characteristics.

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