Highly transparent bismuth oxide thin films deposition: morphology - optical properties correlation studies

作者：Condurache Bota S^*; Tiron V; Praisler M

来源：Journal of Optoelectronics and Advanced Materials, 2015, 17(9-10): 1296-1301.

• Thin films
• Bismuth oxide
• Roughness
• Atomic Force Microscopy
• Optical parameters

Bismuth oxide thin films have proved to exhibit properties that recommend them for a large area of applications, from Optoelectronics to humidity and other oxygen-containing gases sensors. Still, scarce references have been found so far as concerning high optically-transmitting bismuth oxide thin films. This paper reports on such highly transparent bismuth oxide films, with over 60 % transmittance within the 500-1100 nm spectral range. Pulsed laser deposition was the method of choice for the preparation of the films. It is also showed here that the morphology plays an important role concerning many optical properties of the resulting films, from the transmittance, to the reflectivity, to the absorption coefficient and as related to the refractive index, respectively. The deposition conditions change the roughness of the films which, in turn, affects the optical parameters.

• 出版日期2015-10