Near-field optical data storage using C-apertures

作者：Leen J Brian^*; Hansen Paul; Cheng Yao Te; Gibby Aaron; Hesselink Lambertus

来源：Applied Physics Letters, 2010, 97(7): 073111.

DOI：10.1063/1.3474801

• atomic force microscopy
• focused ion beam technology
• optical microscopes
• optical storage

We demonstrate the all-optical recording of deeply subwavelength data bits in Ge(2)Sb(2)Te(5) using a near-field scanning optical microscope (NSOM) probe that utilizes a C-aperture fabricated using through membrane focused ion beam milling. Data bits recorded with various optical powers were read out optically by C-aperture NSOM and the physical bit size was measured by atomic force microscopy (AFM). Both optical and AFM measurements were found to be in excellent agreement with simulation. We achieved a minimum physical bit size of 53.5 x 50.2 nm(2) at a wavelength of 980 nm (lambda/20) indicating a data density of 223 Gbit/in.(2).

• 出版日期2010-8-16