Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photoemission spectroscopy

作者：Petravic M^*; Peter R; Fan L J; Yang Y W; Chen Y

来源：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , 2010, 619(1-3): 94-97.

DOI：10.1016/j.nima.2009.10.118

• Boron nitride
• Nitrogen vacancy
• NEXAFS
• XPS
• Ion bombardment

Formation of defects in hexagonal boron nitride (h-BN) under low-energy argon or nitrogen ion bombardment has been studied by near-edge X-ray absorption fine structure (NEXAFS) around boron and nitrogen K-edges and X-ray photoemission spectroscopy (XPS) from B1s and N1s core levels. Breaking of B-N bonds and formation of nitrogen vacancies have been identified in the B K-edge NEXAFS and B1s XPS measurements, followed by the formation of molecular nitrogen, N(2), at interstitial positions for both argon and nitrogen bombardments. The formation of N(2) produces a sharp resonance in the low-resolution NEXAFS spectra around the N K-edge, showing characteristic vibrational fine structure in high-resolution measurements.

• 出版日期2010-7-1
• 单位迪肯大学