A novel exact method for significance of higher criticism via Steck's determinant

作者:Miecznikowski Jeffrey C*; Wang Jiefei; Gaile Daniel P; Tritchler David L
来源:Statistics & Probability Letters, 2017, 130: 105-110.
DOI:10.1016/j.spl.2017.07.009

摘要

In this note we provide a novel straightforward approach to calculating the significance for higher criticism statistics using a general result due to Steck (1971) coined Steck's determinant. This result allows users to directly assess higher criticism significance without the need for simulation or asymptotic results.

  • 出版日期2017-11

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