Fault-Tolerant SOI Microprocessor for Space Applications

作者：Osipenko Pavel N^*; Antonov Andrey A; Klishin Alexander V; Vasilegin Boris V; Gorbunov Maxim S; Dolotov Pavel S; Zebrev Gennady I; Anashin Vasily S; Emeliyanov Vladimir V; Ozerov Alexander I; Chumakov Alexander I; Yanenko Andrey V; Vasiliev Alexey L

来源：IEEE Transactions on Nuclear Science, 2013, 60(4): 2762-2767.

DOI：10.1109/TNS.2013.2241453

• CMOS
• critical charge
• dual interlocked storage (DICE)
• heavy ions
• microprocessor
• read mode
• RHBD
• Single-Event Upset (SEU)
• silicon-on-insulator (SOI)
• write mode

The design and experimental results are presented for the fault-tolerant 0.35 im SOI CMOS microprocessor. DICE-like cells are shown to be vulnerable to SEU during "read" and "write" modes.

• 出版日期2013-8