摘要
Two nominally identical ultra-stable microwave oscillators are compared. Each incorporates a sapphire resonator cooled to near 6 K in an ultra-low vibration cryostat using a pulse-tube cryocooler. The phase noise for a single oscillator is measured at -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier. The oscillator fractional frequency stability, after subtracting a linear frequency drift of 3.5 x 10(-14)/day, is characterized by 5.3 x 10(-16) tau(-1/2) + 9 x 10(-17) for integration times 0.1 s %26lt; tau %26lt; 1000 s and is limited by a flicker frequency noise floor near 1 x 10(-16).
- 出版日期2012-4-30
- 单位中国科学技术大学