摘要
Electron paramagnetic resonance studies of Si-doped AlxGa1-xN (0.79 <= x <= 1.0) reveal two Si negative-U (or DX) centers, which can be separately observed for x >= 0.84. We found that for the stable DX center, the energy vertical bar E-DX vertical bar of the negatively charged state DX-, which is also considered as the donor activation energy, abruptly increases with Al content for x similar to 0.83-1.0 approaching similar to 240 meV in AlN, whereas E-DX remains to be close to the neutral charge state E-d for the metastable DX center (similar to 11 meV below Ed in AlN).
- 出版日期2014-10-20