ESD sensitivity of a GaAs MMIC microwave power amplifier

作者：Tazzoli Augusto^*; Rossetto Isabella; Zanoni Enrico; Dai Yufeng; Tomasi Tiziana; Meneghesso Gaudenzio

来源：Microelectronics Reliability, 2011, 51(9-11): 1602-1607.

DOI：10.1016/j.microrel.2011.06.051

The EOS/ESD sensitivity of the main circuit blocks of a complete GaAs multi-stage power amplifier for microwave applications was investigated under HBM, MM and TLP regimes. Hard breakdown failure modes were identified due to passive components failure. The high current injection state of active components was also analyzed.

• 出版日期2011-11