AMS MEASUREMENTS OF DEUTERIUM CAPTURED IN TUNGSTEN LAYERS DEPOSITED BY MAGNETRON SPUTTERING

作者：Petre A R; Acsente T; Enachescu M^*; Dinescu G; Stan Sion C; Dogaru M S; Dorobantu I; Neagu L

来源：Romanian Reports in Physics, 2013, 65(4): 1258-1264.

• accelerator mass spectrometry
• depth profiling
• deuterium in materials

The paper presents the upgrading of the Accelerator Mass Spectrometry (AMS) facility of IFIN-HH, Bucharest, performed in order to measure depth profile of hydrogen isotopes concentration in various host materials. Results are also presented concerning the retention of deuterium in different tungsten layers deposited by magnetron sputtering procedure. The tungsten layers were deposited on a silicon substrate separately or simultaneously with the capture of deuterium. Our AMS measurements show that deuterium penetrates in different ways into the material according to the kind of tungsten deposition and it is easily captured below layers of tungsten.

• 出版日期2013