Ultralow-Leakage AlGaN/GaN High Electron Mobility Transistors on Si With Non-Alloyed Regrown Ohmic Contacts

作者：Song Bo^*; Zhu Mingda; Hu Zongyang; Qi Meng; Nomoto Kazuki; Yan Xiaodong; Cao Yu; Jena Debdeep; Xing Huili Grace

来源：IEEE Electron Device Letters, 2016, 37(1): 16-19.

DOI：10.1109/LED.2015.2497252

• Leakage current
• non-alloyed and alloyed ohmic contact
• regrown contact
• trap
• GaN on Si
• HEMT

Without employing gate dielectrics, AlGaN/GaN high-electron mobility transistors (HEMTs) on Si with non-alloyed regrown ohmic contacts exhibit record-low leakage currents similar to 10(-12) A/mm, high ON/OFF current ratios >10(11). Compared with HEMTs with conventional alloyed ohmic contacts, HEMTs with non-alloyed contacts show a reduction of 10(6) in leakage current, a steeper subthreshold slope, and >50% improvement in breakdown voltage. These observations indicate that avoiding high-temperature alloyed ohmic processes can lead to improved device performance.

• 出版日期2016-1