A study of detection schemes in electro-optic sampling technique

作者：Parc Yong Woon^*; Ko In Soo; Kim Changbum; Huang Jung Yun

来源：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , 2008, 586(3): 452-457.

DOI：10.1016/j.nima.2007.12.017

• electro-optic
• electron beam

Electro-optic sampling (EOS) is a powerful tool for the measurement of the electron beam or THz radiation. A new detection scheme called "near crossed polarizer (NCP)" scheme in the EOS technique is developed to increase the signal-to-noise ratio (SNR) in the experiment. The new detection scheme is studied in detail and the 3D scanning result with electron beam in FLASH is compared with the theoretical result of the detection scheme.

• 出版日期2008-3-1