Systematic investigation of the reactive ion beam sputter deposition process of SiO2

作者:Mateev Maria; Lautenschlaeger Thomas; Spemann Daniel; Finzel Annemarie; Gerlach Juergen W; Frost Frank; Bundesmann Carsten
来源:European Physical Journal B, 2018, 91(2): 45.
DOI:10.1140/epjb/e2018-80453-x