科研之友
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摘要
Osmotolerant yeasts are primarily responsible for spoilage of sugar-rich foods. In this work, an electronic nose (e-nose) was used to diagnose contamination caused by two osmotolerant yeast strains (Zygosaccharomyces rouxii and Candida tropicalis) in a high-sugar medium using test panel evaluation as the reference method. Solid-phase microextraction gas chromatography with mass spectrometry (GC-MS) was used to determine the evolution of the volatile organic compound fingerprint in the contaminated samples during yeast growth. Principal component analysis and linear discriminant analysis revealed that the e-nose could identify contamination after 48 h, corresponding to the total yeast levels of 3.68 (Z. rouxii) and 3.09 (C. tropicalis) log CFU/ml. At these levels, the test panel could not yet diagnose the spoilage, indicating that the e-nose approach was more sensitive than the test panel evaluation. Loading analysis indicated that sensors 8 and 6 were the most important for detection of these two yeasts. Based on the result obtained with the e-nose, the incubation time and total yeast levels could be accurately predicted by established multiple regression models with a correlation of greater than 0.97. In the sensory evaluation, spoilage was diagnosed after 72 h in samples contaminated with C. tropicas and after 48 to 72 h for samples contaminated with Z. rouxii. GC-MS revealed that compounds such as acetaldehyde, acetone, ethyl acetate, alcohol, and 3-methyl-1-butanol contributed to spoilage detection by the e-nose after 48 h. In the high-sugar medium, the e-nose was more sensitive than the test panel evaluation for detecting contamination with these test yeast strains. This information could be useful for developing instruments and techniques for rapid scanning of sugar-rich foods for contamination with osmotolerant yeasts before such spoilage could be detected by the consumer.
- 出版日期2015-11
- 单位西北农林科技大学
