摘要

We use analytical aberration-corrected high-resolution scanning transmission electron microscopy to image the atomic structure of the layered ternary transition metal (M) borides, Cr2AlB2, Fe2AlB2, and MoAlB. In these ternaries, MB layers and Al single or double atomic layers are interleaved. The atomic positions of the M elements and Al are clearly resolved by Z-contrast images. The following structural defects are also found and described herein: a 90 degrees twist boundary along [010] in Cr2AlB2, a tilt boundary in Fe2AlB2, and Mo2AlB2-like stacking faults in MoAlB, where some of the MB-based structures are intercalated by one (instead of two) Al layer(s).

  • 出版日期2017