An Electro-Optic Pulsed NVNA Load-Pull System for Distributed E-Field Measurements

作者：Urbonas Jonas^*; Kim Kevin; Vanaverbeke Frederik; Aaen Peter H

来源：IEEE Transactions on Microwave Theory and Techniques, 2018, 66(6): 2896-2903.

DOI：10.1109/TMTT.2018.2816930

• Device characterization
• electro-optic sampling (EOS)
• laterally diffused metal-oxide-semiconductor (LDMOS) transistor
• load-pull (LP)
• near-field measurement

In this paper, a new combined electro-optic (EO) and pulsed nonlinear vector network analyzer-based (NVNA) load-pull measurement system for distributed multiharmonic electric field (E-field) measurements is presented. The system uses an external EO probe to measure cross-frequency phase-coherent multiharmonic vector E-fields with an 8-mu m spatial resolution and 20 MHz-20 GHz bandwidth. We demonstrate the performance of the distributed phase-coherent E-field measurements of E-x, E-y, and E-z components with three harmonics above a commercially available large periphery, packaged, laterally diffused metal-oxide-semiconductor transistor. The transistor was measured at 2.2 GHz under pulsed conditions with 10-mu s pulse and 10% duty cycle, while outputting 55.1 dBm of power. The measured E-fields of the operating transistor are animated for the first time and reveal complex nonuniform operation at harmonic frequencies.

• 出版日期2018-6