Deep level defects in n-type GaAsBi and GaAs grown at low temperatures (vol 113, 133708, 2013)

作者:Mooney P M*; Watkins K P; Jiang Zenan; Basile A F; Lewis R B; Bahrami Yekta V; Masnadi Shirazi M; Beaton D A; Tiedje T
来源:Journal of Applied Physics, 2015, 117(1): 019901.
DOI:10.1063/1.4905390